System & Embedded Electronics
Telexsus provides a range of software and hardware tools for engineers designing complex electronics from initial concept through to volume manufacture. This includes XJTAG boundary scan for hardware bring up and production test, Exostiv FPGA debug for in-depth capture of high-end Xilnx and Intel devices, and dedicated protocol analysers for fast debugging of high-speed serial communications.
Electronic Manufacturing Test
With companies looking for faster, flexible and more cost effective methods of testing their products in production, JTAG boundary scan and functional test equipment is becoming the defacto approach to providing low level board/device test as well as module/system functional test. Telexsus supplies XJTAG boundary scan tools and Eiger Design's J-Testr system for testing digital and mixed-signal boards.
Networking & Data Storage
Protocol analyzers are an essential tool for system, hardware and software engineers in the development and integration of IC’s, electronic products and systems in the Networking and Data Storage markets. Telexsus supply a full range of the Teledyne LeCroy protocol analyzers, exercisers / emulators, jammers and verification tools for SAS, SATA, Fibre Channel, Gigabit Ethernet, PCI Express, NVM Express, and more.
Military & Aerospace
Telexsus supplies design tools and consultancy services to companies developing complex electronic systems for military and aerospace applications. As a partner of Marvin Test Solutions, Telexsus offer a range of PXI-based test systems to fulfil the requirements of new products and the replacement of legacy test equipment. Telexsus also supply the J-Testr, offering a fully-featured compact test system, designed with high-end mil/aero board testing in mind.
Popular products
Upcoming events
JTAG Boundary Scan workshop (Williams Conference Centre, Oxfordshire)
Dates throughout the year. XJTAG's popular workshops are designed to provide design, development, test, and production engineers with a practical hands-on introduction to boundary scan.
Read more